DATE
Design, Automation and Test in Europe／R.Ueno, N.Homma, S.Morioka and T.Aoki, “Automatic Generation of Formally-Proven Tamper-Resistant Galois-Field Multipliers Based on Generalized Masking Scheme”, Design, Automation and Test in Europe (DATE17), Mar. 2017.
CATEGORY
【学会名】
Design, Automation and Test in Europe
【タイトル】
R.Ueno, N.Homma, S.Morioka and T.Aoki, “Automatic Generation of Formally-Proven Tamper-Resistant Galois-Field Multipliers Based on Generalized Masking Scheme”, Design, Automation and Test in Europe (DATE17), Mar. 2017.
【リンク】
https://past.date-conference.com/proceedings-archive/2017/html/0066.html